भारत सरकारGovernment of India
I-STEM — Indian Science, Technology and Engineering facilities Map
TEMMicroscopy & ImagingAvailable

Transmission Electron Microscope (TEM)

Make: JEOL·Model: JEM-2100 Plus·Year installed: 2019

About this instrument

Transmission Electron Microscope (TEM) (JEOL JEM-2100 Plus) hosted at the central instrumentation facility of CSIR-NEERI, Nagpur. Typical applications include lattice and atomic-scale imaging, nanoparticle size and shape, crystal defects and dislocations, selected-area electron diffraction. Available to academia and industry through I-STEM with trained operator support.

Typical applications

  • lattice and atomic-scale imaging
  • nanoparticle size and shape
  • crystal defects and dislocations
  • selected-area electron diffraction
  • catalyst characterisation

Specifications

Accelerating voltage
200 kV
Point resolution
0.25 nm
Modes
BF, DF, SAED, HRTEM

Tariff

Academic / Industryper hour
Academic₹4,800
Industry₹19,200

Similar equipment nearby

Alternatives with the same technique or in the same discipline.