Field Emission Scanning Electron Microscope (FE-SEM)
Make: FEI·Model: Quanta 250 FEG·Year installed: 2019
About this instrument
Field Emission Scanning Electron Microscope (FE-SEM) (FEI Quanta 250 FEG) hosted at the central instrumentation facility of AIIMS New Delhi, New Delhi. Typical applications include surface morphology, nanostructure imaging, fractography & failure analysis, particle size and shape. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface morphology
- nanostructure imaging
- fractography & failure analysis
- particle size and shape
- thin-film cross-section
- EDS elemental mapping
Specifications
- Resolution
- 0.8 nm @ 15 kV
- Accelerating voltage
- 0.02 – 30 kV
- Detectors
- SE, BSE, EDS
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,300 |
| Industry | ₹3,900 |
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