Atomic Force Microscope (AFM)
Make: Park Systems·Model: NX10·Year installed: 2014
About this instrument
Atomic Force Microscope (AFM) (Park Systems NX10) hosted at the central instrumentation facility of Banaras Hindu University, Varanasi. Typical applications include surface roughness measurement, nanoscale topography mapping, thin-film thickness, nanomechanical properties. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface roughness measurement
- nanoscale topography mapping
- thin-film thickness
- nanomechanical properties
- conductive and magnetic mapping
Specifications
- Scan range
- 90 × 90 µm
- Modes
- Tapping, Contact, KPFM, MFM
- Noise floor
- < 0.05 nm
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,400 |
| Industry | ₹7,000 |
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