Atomic Force Microscope (AFM)
Make: Asylum·Model: MFP-3D·Year installed: 2018
About this instrument
Atomic Force Microscope (AFM) (Asylum MFP-3D) hosted at the central instrumentation facility of IIT Patna, Patna. Typical applications include surface roughness measurement, nanoscale topography mapping, thin-film thickness, nanomechanical properties. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface roughness measurement
- nanoscale topography mapping
- thin-film thickness
- nanomechanical properties
- conductive and magnetic mapping
Specifications
- Scan range
- 90 × 90 µm
- Modes
- Tapping, Contact, KPFM, MFM
- Noise floor
- < 0.05 nm
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹800 |
| Industry | ₹2,400 |
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