Atomic Force Microscope (AFM)
Make: Bruker·Model: Dimension Icon·Year installed: 2017
About this instrument
Atomic Force Microscope (AFM) (Bruker Dimension Icon) hosted at the central instrumentation facility of University of Delhi, New Delhi. Typical applications include surface roughness measurement, nanoscale topography mapping, thin-film thickness, nanomechanical properties. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface roughness measurement
- nanoscale topography mapping
- thin-film thickness
- nanomechanical properties
- conductive and magnetic mapping
Specifications
- Scan range
- 90 × 90 µm
- Modes
- Tapping, Contact, KPFM, MFM
- Noise floor
- < 0.05 nm
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,100 |
| Industry | ₹5,500 |
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