Field Emission Scanning Electron Microscope (FE-SEM)
Make: JEOL·Model: JSM-7610F·Year installed: 2016
About this instrument
Field Emission Scanning Electron Microscope (FE-SEM) (JEOL JSM-7610F) hosted at the central instrumentation facility of NIT Warangal, Warangal. Typical applications include surface morphology, nanostructure imaging, fractography & failure analysis, particle size and shape. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface morphology
- nanostructure imaging
- fractography & failure analysis
- particle size and shape
- thin-film cross-section
- EDS elemental mapping
Specifications
- Resolution
- 0.6 nm @ 15 kV
- Accelerating voltage
- 0.02 – 30 kV
- Detectors
- SE, BSE, EDS
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,350 |
| Industry | ₹6,750 |
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