Atomic Force Microscope (AFM)
Make: Asylum·Model: MFP-3D·Year installed: 2014
About this instrument
Atomic Force Microscope (AFM) (Asylum MFP-3D) hosted at the central instrumentation facility of IIT Madras, Chennai. Typical applications include surface roughness measurement, nanoscale topography mapping, thin-film thickness, nanomechanical properties. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface roughness measurement
- nanoscale topography mapping
- thin-film thickness
- nanomechanical properties
- conductive and magnetic mapping
Specifications
- Scan range
- 100 × 100 µm
- Modes
- Tapping, Contact, KPFM, MFM
- Noise floor
- < 0.05 nm
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,300 |
| Industry | ₹6,500 |
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