Atomic Force Microscope (AFM)
Make: Park Systems·Model: NX10·Year installed: 2016
About this instrument
Atomic Force Microscope (AFM) (Park Systems NX10) hosted at the central instrumentation facility of SCTIMST Thiruvananthapuram, Thiruvananthapuram. Typical applications include surface roughness measurement, nanoscale topography mapping, thin-film thickness, nanomechanical properties. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface roughness measurement
- nanoscale topography mapping
- thin-film thickness
- nanomechanical properties
- conductive and magnetic mapping
Specifications
- Scan range
- 100 × 100 µm
- Modes
- Tapping, Contact, KPFM, MFM
- Noise floor
- < 0.05 nm
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,100 |
| Industry | ₹5,500 |
Similar equipment nearby
Alternatives with the same technique or in the same discipline.
Atomic Force Microscope (AFM)
SCTIMST Thiruvananthapuram
Thiruvananthapuram, Kerala
Academic
₹1,600 /hour
Atomic Force Microscope (AFM)
NIT Tiruchirappalli
Tiruchirappalli, Tamil Nadu
Academic
₹1,050 /hour
Atomic Force Microscope (AFM)
IIT Madras
Chennai, Tamil Nadu
Academic
₹1,300 /hour
Atomic Force Microscope (AFM)
IIT Hyderabad
Hyderabad, Telangana
Academic
₹1,250 /hour
Atomic Force Microscope (AFM)
NIT Warangal
Warangal, Telangana
Academic
₹1,150 /hour
Atomic Force Microscope (AFM)
IISER Pune
Pune, Maharashtra
Academic
₹1,000 /hour