Atomic Force Microscope (AFM)
Make: Bruker·Model: Dimension Icon·Year installed: 2025
About this instrument
Atomic Force Microscope (AFM) (Bruker Dimension Icon) hosted at the central instrumentation facility of Jawaharlal Nehru University, New Delhi. Typical applications include surface roughness measurement, nanoscale topography mapping, thin-film thickness, nanomechanical properties. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- surface roughness measurement
- nanoscale topography mapping
- thin-film thickness
- nanomechanical properties
- conductive and magnetic mapping
Specifications
- Scan range
- 100 × 100 µm
- Modes
- Tapping, Contact, KPFM, MFM
- Noise floor
- < 0.05 nm
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹1,800 |
| Industry | ₹7,200 |
Similar equipment nearby
Alternatives with the same technique or in the same discipline.
Atomic Force Microscope (AFM)
University of Delhi
New Delhi, Delhi
Academic
₹1,100 /hour
Atomic Force Microscope (AFM)
IIT Ropar
Rupnagar, Punjab
Academic
₹1,150 /hour
Atomic Force Microscope (AFM)
IISER Bhopal
Bhopal, Madhya Pradesh
Academic
₹1,550 /hour
Atomic Force Microscope (AFM)
IISER Bhopal
Bhopal, Madhya Pradesh
Academic
₹1,350 /hour
Atomic Force Microscope (AFM)
IISER Bhopal
Bhopal, Madhya Pradesh
Academic
₹1,600 /hour
Atomic Force Microscope (AFM)
IISER Bhopal
Bhopal, Madhya Pradesh
Academic
₹900 /hour