Transmission Electron Microscope (TEM)
Make: FEI·Model: Tecnai G2 20·Year installed: 2018
About this instrument
Transmission Electron Microscope (TEM) (FEI Tecnai G2 20) hosted at the central instrumentation facility of NIT Rourkela, Rourkela. Typical applications include lattice and atomic-scale imaging, nanoparticle size and shape, crystal defects and dislocations, selected-area electron diffraction. Available to academia and industry through I-STEM with trained operator support.
Typical applications
- lattice and atomic-scale imaging
- nanoparticle size and shape
- crystal defects and dislocations
- selected-area electron diffraction
- catalyst characterisation
Specifications
- Accelerating voltage
- 200 kV
- Point resolution
- 0.23 nm
- Modes
- BF, DF, SAED, HRTEM
Tariff
| Academic / Industry | per hour |
|---|---|
| Academic | ₹4,400 |
| Industry | ₹22,000 |
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